Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution

Author(s):  
Sun-Keun Seo ◽  
Bong-Jin Yum
Author(s):  
Mashroor Ahmad Khan ◽  
Navin Chandra

 In this paper, a step-stress accelerated life test with two stress variables for Weibull distribution under progressive type-I censoring is considered. The stress-life relationship as a log-linear function of stress levels, and for each combination of stress levels, a cumulative exposure model is assumed. The maximum likelihood and Bayes estimates of the model parameters are obtained. The optimum test plan is developed using variance-optimality criterion, which consists in finding out the optimal stress change time by minimizing asymptotic variance of the maximum likelihood estimates of the log of the scale parameter at the design stress. The proposed study illustrated by using simulated data.


Sign in / Sign up

Export Citation Format

Share Document